[1]范宜仁,蒋建亮,邓少贵,等.高分辨率阵列侧向测井响应数值模拟[J].测井技术,2009,33(04):333-336.
 FAN Yi-ren,JIANG Jian-liang,DENG Shao-gui,et al.Numerical Simulation of High Resolution Array Lateral Logging Responses[J].WELL LOGGING TECHNOLOGY,2009,33(04):333-336.
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高分辨率阵列侧向测井响应数值模拟()
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《测井技术》[ISSN:1004-1338/CN:61-1223/TE]

卷:
第33卷
期数:
2009年04期
页码:
333-336
栏目:
方法研究
出版日期:
2009-08-30

文章信息/Info

Title:
Numerical Simulation of High Resolution Array Lateral Logging Responses
作者:
范宜仁;蒋建亮;邓少贵;陈华;
中国石油大学地球资源与信息学院;
Author(s):
FAN Yi-renJIANG Jian-liangDENG Shao-guiCHEN Hua
College of Geo-Resource and Information,China University of Petroleum,Dongying,Shandong 257061,China
关键词:
阵列侧向测井有限元法数值模拟电阻率正演响应
分类号:
P631.811
摘要:
阵列侧向测井能够提供RL,A0~RL,A5等6条不同探测深度的电阻率曲线,可以直观反映地层不同径向深度电阻率的变化。利用有限元方法,在简化的二维非均匀介质模型下对阵列侧向测井响应进行了数值模拟,研究了不同层厚、侵入带、井眼条件下阵列侧向测井响应,与双侧向测井响应进行了对比。研究表明,阵列侧向测井所测得的RL,A5~RL,A1等5条电阻率曲线为同时反演侵入深度、侵入带电阻率和原状地层电阻率提供了丰富的信息;其多条不同探测深度的电阻率曲线探测深度依次增加,受围岩影响小,能够详细描述侵入剖面,真实地反映地层电阻率径向分布;RL,A0探测深度最浅,主要反映井眼泥浆的电阻率情况,为准确了解井眼内及井壁附近的电阻率分布提供了依据。在实际应用中应结合实际现场的各方面因素对阵列侧向测井曲线进行全面的分析。

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更新日期/Last Update: 2009-08-30